发明名称 ALIGNMENT OF AN ATOM BEAM WITH AN ELECTRIC FIELD IN THE PRODUCTION OF A CHARGED PARTICLE SOURCE
摘要 A method for aligning the axis of an atom beam with the orientation of an electric field at a particular location within an enclosure for use in creating a charged particle source by photoionizing a cold atom beam. The method includes providing an atom beam in the enclosure, providing a plurality of electrically conductive devices in said enclosure, evacuating the enclosure to a pressure below about 10-6 millibar, and aligning the axis of the atom beam with the orientation of the electric field, relative to each other, within less than about two degrees. Alignment may be facilitated by applying at least one voltage to the electrically conductive devices, mechanically tilting the atom beam's axis orientation of the electric field relative to each other and/or causing a deflection of the atom beam.
申请公布号 US2013320202(A1) 申请公布日期 2013.12.05
申请号 US201313962346 申请日期 2013.08.08
申请人 MCCLELLAND JABEZ;KNUFFMAN BRENTON;STEELE ADAM;UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCE, NIST 发明人 MCCLELLAND JABEZ;KNUFFMAN BRENTON;STEELE ADAM
分类号 H01J27/02;H01J27/24;H05H3/02 主分类号 H01J27/02
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