发明名称 |
Inspection system, management server, inspection apparatus and method for managing inspection data |
摘要 |
<p>An inspection system is provided that can efficiently perform the management of data obtained from a plurality of apparatuses. An inspection system (10) includes inspection apparatuses (11 a), (11 b) and (11c) to inspect products that are produced in a factory, and a management server (30) that is connected via a communication line to the inspection apparatuses (11a), (11 b) and (11c). The inspection apparatus (11a) includes an apparatus-side inspection result DB (database) (14a). The apparatus-side inspection result DB (14a) stores the inspection result data, which is data representing the result of inspecting a substrate with the inspection apparatus (11 a). The apparatus-side inspection result DB (14a) is a key-value database that is constituted by keys and values.</p> |
申请公布号 |
EP2492767(A3) |
申请公布日期 |
2013.12.04 |
申请号 |
EP20110186856 |
申请日期 |
2011.10.27 |
申请人 |
OMRON CORPORATION |
发明人 |
KAWATA, AKIHIRO;SATO, TSUYOSHI;HISAIZUMI, TAKUYA |
分类号 |
G05B19/418;G05B23/02 |
主分类号 |
G05B19/418 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|