发明名称 Inspection system, management server, inspection apparatus and method for managing inspection data
摘要 <p>An inspection system is provided that can efficiently perform the management of data obtained from a plurality of apparatuses. An inspection system (10) includes inspection apparatuses (11 a), (11 b) and (11c) to inspect products that are produced in a factory, and a management server (30) that is connected via a communication line to the inspection apparatuses (11a), (11 b) and (11c). The inspection apparatus (11a) includes an apparatus-side inspection result DB (database) (14a). The apparatus-side inspection result DB (14a) stores the inspection result data, which is data representing the result of inspecting a substrate with the inspection apparatus (11 a). The apparatus-side inspection result DB (14a) is a key-value database that is constituted by keys and values.</p>
申请公布号 EP2492767(A3) 申请公布日期 2013.12.04
申请号 EP20110186856 申请日期 2011.10.27
申请人 OMRON CORPORATION 发明人 KAWATA, AKIHIRO;SATO, TSUYOSHI;HISAIZUMI, TAKUYA
分类号 G05B19/418;G05B23/02 主分类号 G05B19/418
代理机构 代理人
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