发明名称 OMITTED
摘要 The present invention relates to a wafer transfer robot test simulation system for a cluster tool which performs a treatment process on a wafer in semiconductor manufacturing equipment. During the regular repair and maintenance work of the wafer transfer robot, the wafer transfer robot is detached from the cluster tool, dissembled to replace components, cleaned, reassembled, and then installed at a jig. Using a simulation controller tool where a motion board and a simulation program are mounted, a moving test of the robot can be performed to enable the execution of a reliable process.
申请公布号 KR101337868(B1) 申请公布日期 2013.12.04
申请号 KR20120153637 申请日期 2012.12.26
申请人 LEE, SANG HYUB 发明人 LEE, SANG HYUB
分类号 G01R31/01;G01R31/3167;G06F9/45;G06F11/22 主分类号 G01R31/01
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