发明名称 |
SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
<p>The present invention provides a method for manufacturing a semiconductor package including accurate through wiring with a low process defect. According to one embodiment of the present invention, the semiconductor package includes an insulating substrate including a first through part and a second through part; through wiring charging the first through part and penetrating the insulating substrate; a semiconductor chip electrically connected to the through wiring and located in the second through part; a molding member having a recess region exposing the uppermost part of the through wiring and molding the insulating substrate and the semiconductor chip; a rewiring pattern layer electrically connecting the semiconductor chip and the through wiring and located on the lower part of the insulating substrate; and an external connection member electrically connected to the rewiring pattern layer.</p> |
申请公布号 |
KR20130132162(A) |
申请公布日期 |
2013.12.04 |
申请号 |
KR20120056341 |
申请日期 |
2012.05.25 |
申请人 |
NEPES CO., LTD. |
发明人 |
KWON, YONG TAE;PARK, KYUNG HOON |
分类号 |
H01L23/48 |
主分类号 |
H01L23/48 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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