发明名称 INSERT CARRIER FOR TESTING SEMICONDUCTOR
摘要 PURPOSE: An insert carrier and a manufacturing method thereof are provided to prevent damage to the structure of a carrier by repetitively supporting a semiconductor package. CONSTITUTION: A supporting plate (330) is arranged at a lower surface (313) of a pocket unit (310) and includes a film (331) connecting to the lower surface and a metal frame (335). The metal frame corresponds to the external area of the film. A combining hole (333) is formed at the external area. Another combining hole (336) corresponding to the combining hole is formed on the metal frame. The combining hole of the metal frame includes a first inner diameter unit (337) and a second inner diameter unit (338).
申请公布号 KR101336649(B1) 申请公布日期 2013.12.04
申请号 KR20120039488 申请日期 2012.04.17
申请人 发明人
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
主权项
地址
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