Device and method for repair analysis

摘要

A device for repair analysis includes a selection unit and an analysis unit. The selection unit is configured to select a part of the row addresses of a plurality of spare pivot fault cells and a part of the column addresses of the spare pivot fault cells in response to a control code. The analysis unit is configured to generate an analysis signal indicating whether row addresses of a plurality of non-spare pivot fault cells are included in selected row addresses and column addresses of the non-spare pivot fault cells are included in selected column addresses.