发明名称 Method for forming a salicide layer
摘要 The present invention provides a method for forming a salicide layer. First, a metal-atom-containing layer is formed on a substrate, a first rapid thermal process (RTP) is then performed to the metal-atom-containing layer to form a transitional salicide layer on a specific region. The metal-atom-containing layer is then removed, a thermal conductive layer is formed on the surface of the transitional salicide layer, and a second RTP is performed on the transitional salicide layer.
申请公布号 US8598033(B1) 申请公布日期 2013.12.03
申请号 US201213646726 申请日期 2012.10.07
申请人 UNITED MICROELECTRONICS CORP. 发明人 LAI KUO-CHIH;HSU CHIA CHANG;LIAO BOR-SHYANG;LIN CHUN-LING;HUANG SHU MIN;CHENG MIN-CHUNG;HSU CHI-MAO
分类号 H01L21/4763 主分类号 H01L21/4763
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