发明名称 |
Cantilever for scanning probe microscope and scanning probe microscope equipped with it |
摘要 |
A microscope including both an atomic force microscope and a near-field optical microscope and capable of performing electrochemical measurements and a cantilever for the microscope are disclosed. A pointed light transmitting material employed as the probe of an atomic force microscope is coated with a metal layer; the metal layer is further coated with an insulating layer; the insulating layer is removed only at the distal end to expose the metal layer; the slightly exposed metal layer is employed as a working electrode; and the probe can be employed not only as the probe of the atomic force microscope and the near-field optical microscope but also as the electrode of an electrochemical microscope. Consequently, the microscope can have the functions of an atomic force microscope, a near-field optical microscope and an electrochemical microscope. |
申请公布号 |
US8601608(B2) |
申请公布日期 |
2013.12.03 |
申请号 |
US20060887348 |
申请日期 |
2006.03.30 |
申请人 |
MARUYAMA KENICHI;SUZUKI KOJI;IYOKI MASATO;JAPAN SCIENCE AND TECHNOLOGY AGENCY;SII NANOTECHNOLOGY INC. |
发明人 |
MARUYAMA KENICHI;SUZUKI KOJI;IYOKI MASATO |
分类号 |
G01Q60/22;G01Q10/00;G01Q60/02;G01Q70/10;G01Q70/14;G01Q70/16 |
主分类号 |
G01Q60/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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