发明名称 E/P durability by using a sub-range of a full programming range
摘要 An instruction to perform an erase on a group of one or more memory cells is sent. An indication that the erasure of the group of memory cells is unsuccessful is received. In response to receiving the indication that the erasure of the group of memory cells is unsuccessful, the value of a voltage threshold, associated with the group of memory cells, is changed to a new voltage threshold and the new voltage threshold and identification information associated with the group of memory cells is stored.
申请公布号 US8599621(B2) 申请公布日期 2013.12.03
申请号 US201313758485 申请日期 2013.02.04
申请人 LINK-A-MEDIA DEVICES CORPORATION;SK HYNIX MEMORY SOLUTIONS INC. 发明人 YEUNG KWOK W.;LEE MENG-KUN
分类号 G11C16/04;G11C11/56 主分类号 G11C16/04
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