发明名称 Nonvolatile semiconductor memory device
摘要 A nonvolatile semiconductor memory device includes a control circuit configured to control a soft program operation of setting nonvolatile memory cells to a first threshold voltage distribution state of the nonvolatile memory cells. When a characteristic of the nonvolatile memory cells is in a first state, the control circuit executes the soft program operation by applying a first voltage for setting the nonvolatile memory cells to the first threshold voltage distribution state to first word lines, and applying a second voltage higher than the first voltage to a second word line. When the characteristic of the nonvolatile memory cells is in a second state, the control circuit executes the soft program operation by applying a third voltage equal to or lower than the first voltage to the first word lines and applying a fourth voltage lower than the second voltage to the second word line.
申请公布号 US8599617(B2) 申请公布日期 2013.12.03
申请号 US201213457560 申请日期 2012.04.27
申请人 SHIINO YASUHIRO;TAKAHASHI EIETSU;KABUSHIKI KAISHA TOSHIBA 发明人 SHIINO YASUHIRO;TAKAHASHI EIETSU
分类号 G11C16/06;G11C16/04 主分类号 G11C16/06
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