| 摘要 |
The present invention relates to an embedded device test automating system using an independent interface method and a method. It includes a host terminal transmitting test control commands by converting them into data packets according to a test protocol and an embedded device testing the data packets by analyzing them and transmitting a test result to the host terminal by converting it into a data packet according to the test protocol. The host terminal includes an input part receiving a random data value or test control command, a host application part requesting a test on the embedded device, a test library part providing a standardized test application program interface to the host application part by forming the test protocol, an abstracting part analyzing the data packet received from the embedded device, an interface part processing transceiving with the embedded device, a driver part providing a physical link with the embedded device by being connected with the interface part, and a control part controlling the input part, the host application part, the test library part, the abstracting part, the interface part, and the driver part. [Reference numerals] (100) Host terminal;(110) Input part;(120) Host application part;(130) Test library part;(140) Abstracting part;(141) Converting module;(142) Analyzing module;(150) Exploring part;(160) Interface part;(170) Driver part;(180) Output part;(190) Control part;(200) Embedded device;(210) Target test part;(220) Target abstracting part;(230) Target interface part;(240) Target driver part;(250) Target control part |
