| 摘要 |
The present invention relates to a measurement apparatus for photonic Hall effects, capable of easily identifying electrical characteristics of not only normal Hall devices but also solar cell devices or optical sensor devices, etc. as configuration enables measurement of Hall voltages of a sample under the condition irradiated by a light source, and of measuring Hall effects for high-resistance devices or conductive devices other than normal Hall devices as separate external electric currents other than a constant electric current can be supplied. Measurement apparatus for photonic Hall effects comprises; a dark room forming box provided with an opening/closing door in the front; and a sample holder detachably combined inside the dark room forming box to mount samples; and magnets provided respectively on both sides of the sample holder inside the dark room forming box to form a magnetic field in the sample; and an electric current supply unit provided on one side of the dark room forming box and electrically connected to the sample holder to supply electric currents to the sample; and a light source generating unit provided on one side of the dark room forming box; and an optical transmission cable connecting the light source generating unit and the dark room forming box to provide the sample on the sample holder with light generated from the light generating unit ; and a measurement unit connected to the sample holder to measure Hall voltages of the sample. |
