| 摘要 |
A semiconductor component sorting system comprises N (an integer greater than 0) sorting devices for executing a loading step of loading a semiconductor component to be tested on to a test pallet and an unloading step of separating the tested semiconductor component from the test pallet; a sorting conveying unit for carrying the test pallet along the direction where the sorting devices are arranged; M (an integer greater than M) test devices separated from the sorting devices; a test carrying unit for carrying the test pallet along the direction where the test devices are arranged; and a connection carrying unit which is connected respectively with the sorting conveying unit and the test carrying unit to carry the test pallet between the sorting devices and the test devices. Compared with devices conducting the loading and unloading steps, the semiconductor component sorting system comprises more devices for carrying out test steps. Even difference exist among the time for carrying out the loading step, the unloading step and the test step, the work time delay can be prevented, so as to improve the semiconductor component production efficiency. |
