发明名称 HEMT GaN DEVICE WITH A NON-UNIFORM LATERAL TWO DIMENSIONAL ELECTRON GAS PROFILE AND METHOD OF MANUFACTURING THE SAME
摘要 A high electron mobility field effect transistor (HEMT) having a substrate, a channel layer on the substrate and a barrier layer on the channel layer includes a stress inducing layer on the barrier layer, the stress inducing layer varying the piezo-electric effect in the barrier layer in a drift region between a gate and a drain. A two dimensional electron gas (2DEG) has a non-uniform lateral distribution in the drift region between the gate and the drain.
申请公布号 US2013313612(A1) 申请公布日期 2013.11.28
申请号 US201213478609 申请日期 2012.05.23
申请人 KHALIL SAMEH;BOUTROS KARIM S.;SHINOHARA KEISUKE;HRL LABORATORIES, LLC 发明人 KHALIL SAMEH;BOUTROS KARIM S.;SHINOHARA KEISUKE
分类号 H01L29/778;H01L21/336 主分类号 H01L29/778
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