发明名称 Ramping Pass Voltage To Enhance Channel Boost In Memory Device
摘要 In a non-volatile storage system, first and second substrate channel regions for an unselected NAND string are boosted during programming to inhibit program disturb. The first and second substrate channel regions are created on either side of an isolation word line. During a program pulse time period in which a program pulse is applied to a selected word line, a voltage applied to an unselected word line which extends directly over the second channel region is stepped up to a respective pre-program pulse voltage, at a faster rate at which a voltage applied to an unselected word line which extends directly over the first channel region is stepped up to a respective pre-program pulse voltage. This helps improve the isolation between the channel regions.
申请公布号 US2013314987(A1) 申请公布日期 2013.11.28
申请号 US201313955597 申请日期 2013.07.31
申请人 SANDISK TECHNOLOGIES INC. 发明人 HEMINK GERRIT JAN;LEE SHIH-CHUNG;KHANDELWAL ANUBHAV;CHIN HENRY;LIANG GUIRONG;LEE DANA
分类号 G11C16/34 主分类号 G11C16/34
代理机构 代理人
主权项
地址