发明名称 SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
摘要 <p>According to the present invention, a silicon carbide substrate (10) has a first conductivity type. The silicon carbide substrate (10) has a first surface (P1) provided with a first electrode (41), and a second surface (P2) provided with first trenches (TR1) disposed at a distance from each other. A gate layer (21) covers the internal surface of each of the first trenches (TR1). The gate layer (21) has a second conductivity type, which is different from the first conductivity type. A filling part (31) fills each of the first trenches (TR1) covered by the gate layer (21). A second electrode (42) is separated from the gate layer (21) and provided on the second surface (P2) of the silicon carbide substrate. A gate electrode (40) is electrically insulated from the silicon carbide substrate (10) and electrically connected to the gate layer (21). A silicon carbide semiconductor device that can be readily manufactured is thereby provided.</p>
申请公布号 WO2013175880(A1) 申请公布日期 2013.11.28
申请号 WO2013JP60609 申请日期 2013.04.08
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 HAYASHI, HIDEKI;MASUDA, TAKEYOSHI
分类号 H01L21/337;H01L21/338;H01L27/098;H01L29/808;H01L29/812 主分类号 H01L21/337
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