发明名称 |
SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME |
摘要 |
<p>According to the present invention, a silicon carbide substrate (10) has a first conductivity type. The silicon carbide substrate (10) has a first surface (P1) provided with a first electrode (41), and a second surface (P2) provided with first trenches (TR1) disposed at a distance from each other. A gate layer (21) covers the internal surface of each of the first trenches (TR1). The gate layer (21) has a second conductivity type, which is different from the first conductivity type. A filling part (31) fills each of the first trenches (TR1) covered by the gate layer (21). A second electrode (42) is separated from the gate layer (21) and provided on the second surface (P2) of the silicon carbide substrate. A gate electrode (40) is electrically insulated from the silicon carbide substrate (10) and electrically connected to the gate layer (21). A silicon carbide semiconductor device that can be readily manufactured is thereby provided.</p> |
申请公布号 |
WO2013175880(A1) |
申请公布日期 |
2013.11.28 |
申请号 |
WO2013JP60609 |
申请日期 |
2013.04.08 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD. |
发明人 |
HAYASHI, HIDEKI;MASUDA, TAKEYOSHI |
分类号 |
H01L21/337;H01L21/338;H01L27/098;H01L29/808;H01L29/812 |
主分类号 |
H01L21/337 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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