发明名称 PACKAGING SUBSTRATE WITH RELIABLE VIA STRUCTURE
摘要 A packaging substrate includes a high reliability via structure that extends through multiple layers of the packaging substrate. The via structure includes an opening formed through multiple layers of the packaging substrate and an electrically conductive layer that is deposited in the opening. The opening is formed in a single material removal process and the conductive layer is formed in a single deposition process. Because the conductive layer is formed in a single deposition process, the conductive layer provides an interface-free conductive path between the multiple layers.
申请公布号 US2013313720(A1) 申请公布日期 2013.11.28
申请号 US201213481173 申请日期 2012.05.25
申请人 ZHANG LEILEI;BOKHAREY ZUHAIR 发明人 ZHANG LEILEI;BOKHAREY ZUHAIR
分类号 H01L23/498;H01L21/768 主分类号 H01L23/498
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