发明名称 Electrical Interconnections of Semiconductor Devices and Methods for Fabricating the Same
摘要 Provided are electrical interconnections and methods for fabricating the same. The electrical interconnection may include a substrate including a bonding pad, a solder ball electrically connected to the bonding pad, a solder supporter on the bonding pad, a portion of the solder ball filling the solder supporter, and a metal layer between the bonding pad and the solder supporter, the metal layer having an ionization tendency lower than the bonding pad.
申请公布号 US2013313707(A1) 申请公布日期 2013.11.28
申请号 US201313826694 申请日期 2013.03.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI JU-IL;PARK JEONG-WOO;JIN JEONGGI;PARK YEUN-SANG
分类号 H01L23/00 主分类号 H01L23/00
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