| 摘要 |
<p>The disclosure provides an electromagnetic (EM) sensor system and method that permits rapid and non-invasive measurement of material properties using measurements of the dispersion of EM energy signals over a wide band of frequencies, including second and higher order moments. The EM energy can be a pulse signal, including an ultra-wide band ("UWB") pulse signal. A plurality of signals can be incrementally projected through the material in a grid. The grid can generally include a series of projections through the material of an object at different angles. The further analysis of the dispersion characteristics of the EM energy signal provides a measure of added features that assist in improved characterization of the material properties. In at least one embodiment, the results of processed pulses through the object can be used to form a two-dimensional or three-dimensional image of the material for the particular property being measured.</p> |
