LOCAL COATING METHOD OF CONTACT FINGER FOR TESTING SEMICONDUCTOR USING THERMAL CONDUCTIVITY

摘要

A local coating method of a contact finger for testing a semiconductor is disclosed. The local coating method of a contact finger for testing a semiconductor by one embodiment of the invention comprises a first step of selectively heating the central part while transferring multiple contact fingers with a bent part on the central part in row; a second step of forming a coating part on the whole surface of the contact finger by dipping the contact finger in a coating solution container in which a coating solution is contained and performing dip-coating; and a third step of removing both ends of the coating part.