发明名称 CMP COMPOSITION CONTAINING ZIRCONIA PARTICLES AND METHOD OF USE
摘要 The invention provides a chemical-mechanical polishing composition containing zirconia particles, a modifying agent that adheres to the zirconia particles, an organic acid, and water, as well as a method of using such a polishing composition to polish substrates and a method of using a polishing composition comprising zirconia particles, an organic acid, an oxidizing agent, and water to polishing substrates containing metal and oxide-based dielectric materials.
申请公布号 US2013313225(A1) 申请公布日期 2013.11.28
申请号 US201213477535 申请日期 2012.05.22
申请人 JIN WIECHANG;PARKER JOHN;REMSEN ELIZABETH;CABOT MICROELECTRONICS CORPORATION 发明人 JIN WIECHANG;PARKER JOHN;REMSEN ELIZABETH
分类号 C09K13/06;B44C1/22;C09K13/00;C23F1/18 主分类号 C09K13/06
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