| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device in which testing can be simultaneously performed for a plurality of sector addresses.SOLUTION: A semiconductor device 1 according to one embodiment of the present invention includes: a memory area 2 that has a first sector 21 and a second sector 22; a first address selection unit 3 that selects a predetermined address of the first sector 21 on the basis of an address selection signal: a second address selection unit 4 that selects a predetermined address of the second sector 22 on the basis of the address selection signal; a selector selection unit 5 that makes the first selection unit 3 and second address selection unit 4 select the addresses on the basis of sector selection signals; and a data writing unit 6 that outputs a test signal to the predetermined address of the first sector 21 and the predetermined address of the second sector 22. |
