DEVICE AND METHOD FOR MEASURING THICKNESS OF ELECTROCHEMICAL ELEMENT

摘要

PROBLEM TO BE SOLVED: To provide a device and method for accurately measuring the thickness of a coating layer on a metal foil surface in a simple structure.SOLUTION: When a radiation source 51 is used to irradiate an electrode non-coated portion 87 of an electrode plate material 46 with radiation and the thickness of metal foil 84 as a base material is measured, an attenuator 71 attenuating a proper amount of radiation is interposed in the radiation path between the radiation source 51 irradiating the metal foil 84 and a radiation detector 52, and the intensity of transmitted radiation detected by the radiation detector 52 is caused to fall within a detection range 810 of radiation intensity of the radiation detector 52.