发明名称 |
Substrates Comprising Integrated Circuitry, Methods Of Processing A Substrate Comprising Integrated Circuitry, And Methods Of Back-Side Thinning A Substrate Comprising Integrated Circuitry |
摘要 |
A method of processing a substrate having integrated circuitry includes forming through-substrate vias partially through the substrate from a first side of the substrate. At least one through-substrate structure is formed partially through the substrate from the first substrate side. The at least one through-substrate structure extends deeper into the substrate than do the through-substrate vias. Substrate material is removed from a second side of the substrate to expose the through-substrate vias and the at least one through-substrate structure on the second substrate side. Additional implementations are disclosed. Integrated circuit substrates are disclosed independent of method of manufacture.
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申请公布号 |
US2013313718(A1) |
申请公布日期 |
2013.11.28 |
申请号 |
US201213480341 |
申请日期 |
2012.05.24 |
申请人 |
VARGHESE SONY;CARSWELL ANDREW;SAKAI KOZABURO;ZAGREBELNY ANDREY V.;HUANG WAYNE;LU JIN;RAMAKRISHNAN SURESH;MICRON TECHNOLOGY, INC. |
发明人 |
VARGHESE SONY;CARSWELL ANDREW;SAKAI KOZABURO;ZAGREBELNY ANDREY V.;HUANG WAYNE;LU JIN;RAMAKRISHNAN SURESH |
分类号 |
H01L23/498;H01L21/66;H01L21/768 |
主分类号 |
H01L23/498 |
代理机构 |
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地址 |
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