发明名称 IMPLEMENTING DECOUPLING DEVICES INSIDE A TSV DRAM STACK
摘要 A method and structures are provided for implementing decoupling capacitors within a DRAM TSV stack. A DRAM is formed with a plurality of TSVs extending completely through the substrate and filled with a conducting material. A layer of glass is grown on both the top and bottom of the DRAM providing an insulator. A layer of metal is grown on each glass layer providing a conductor. The metal and glass layers are etched through to TSVs with a gap provided around the perimeter of via pads. A respective solder ball is formed on the TSVs to connect to another DRAM chip in the DRAM TSV stack. The metal layers are connected to at least one TSV by one respective solder ball and are connected to a voltage source and a dielectric is inserted between the metal layers in the DRAM TSV stack to complete the decoupling capacitor.
申请公布号 US2013313705(A1) 申请公布日期 2013.11.28
申请号 US201213477371 申请日期 2012.05.22
申请人 HENDERSON JOAB D.;KIM KYU-HYOUN;MAULE WARREN E.;WRIGHT KENNETH L.;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 HENDERSON JOAB D.;KIM KYU-HYOUN;MAULE WARREN E.;WRIGHT KENNETH L.
分类号 H01L23/498;H01L21/768 主分类号 H01L23/498
代理机构 代理人
主权项
地址