发明名称 DEVICE AND METHOD FOR INSPECTING SURFACE DEFECT
摘要 PROBLEM TO BE SOLVED: To provide a device and a method for inspecting surface defects, which enable detection and identification of damages and dirt on an outer peripheral surface of a round bar.SOLUTION: A surface defect inspection device includes: a laser light source which irradiates an inspection point on an outer peripheral surface of a round bar with laser light at an elevation angle of 5 to 45 degrees with respect to an axis of the round bar from the axial direction thereof; a plurality of light receiving sensors which receive reflection of the laser light reflected from the outer peripheral surface of the round bar; and surface defect detection means for detecting surface defects on the basis of intensity of light received by the plurality of light receiving sensors. The plurality of light receiving sensors are arranged in a matrix form along the outer circumference of the round bar at a radial distance. The surface defect detection means detects a position of a reflection ring of the laser light reflected from the outer peripheral surface of the round bar on the basis of intensity of light received by each of the plurality of light receiving sensors arranged in a matrix form. It is detected as a surface defect when the difference between intensity of light received by a light receiving sensor located at the position of the reflection ring and intensity of light received by a light receiving sensor adjacent to the light receiving sensor located at the position of the reflection ring is equal to or greater than a predetermined value.
申请公布号 JP2013238560(A) 申请公布日期 2013.11.28
申请号 JP20120113230 申请日期 2012.05.17
申请人 SHIMOMURA TOKUSHU KAKO KK;OISHI SOKKI KK 发明人 ARAKAWA TORU;WATANABE HIROYUKI;OISHI JINICHI
分类号 G01N21/892;G01N21/952 主分类号 G01N21/892
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