AUTOMATIC ANALYSIS DEVICE

摘要

There is provided an automatic analyzer that can detect a measurement target substance at high sensitivity without increase in a size of the device and complication of the device by correcting variation in light quantity data caused by thermal deformation of an optical system due to temperature variation inside the device. The scattered light from the measurement target substance passes through a light receiving window 43, and is received by a detector 45a for +¸ scattered light and a detector 45b for -¸ scattered light which are arranged symmetrically to each other across an optical axis at an equal angle or an equal interval in a vertical direction. A light source 40 is fixed by a light-source holder (that is a base member on which the light source is arranged) 46, and the detectors 45a and 45b are arranged on and fixed to a detector holder (that is a base member on which the detectors are arranged) 47. In this manner, drift of the light quantity data caused by the thermal deformation of the optical system can be corrected by comparing values of the light quantity data of the detectors 45a and 45b.