发明名称 POLISHING PAD WITH CONTROLLED VOID FORMATION
摘要 <p>A chemical-mechanical planarization polishing pad is provided comprising a network of elements dispersed within a polymer, a plurality of voids formed in the pad and at least a portion of said network of elements is connected to at least a portion of the voids. A method of forming the pad is also disclosed, which comprises providing a composition, the composition comprising a network of elements and at least one of a polymer or a reactive prepolymer, introducing a gas to the composition and using the gas to produce a plurality of voids in the composition. A method of forming voids is also disclosed, which relies upon the application of a force to the network of elements within the polymer or reactive polymer, followed by removal of the force and void formation.</p>
申请公布号 EP2271463(A4) 申请公布日期 2013.11.27
申请号 EP20080873724 申请日期 2008.10.02
申请人 INNOPAD, INC. 发明人 LEFEVRE, PAUL;WELLS, DAVID ADAM;JIN, MARC C.;HSU, OSCAR K.;ALDEBORGH, JOHN ERIK;WU, GUANGWEI;MATHEW, ANOOP;QIAO, SCOTT, XIN
分类号 B24B37/24 主分类号 B24B37/24
代理机构 代理人
主权项
地址