发明名称 GRINDING ABNORMALITY MONITORING METHOD AND GRINDING ABNORMALITY MONITORING DEVICE
摘要 <p>A grinding abnormality monitoring method and device for grinding a plurality of works of the same type are proposed which can improve the accuracy of judgment whether an abnormality is generated or not by properly setting a threshold value. According to the method or the device, by setting at least one of upper (T1) and lower (T2) limit values of a trial grinding load detected at the trial grinding of at least one of the works, the trial grinding load varying depending on an elapsed time from the start of the trial grinding or a position of work W relative to a grinding wheel 43, an occurrence of grinding abnormality is judged when an actual grinding load detected at the actual grinding of work W exceeds at least one of the upper (T1) and lower (T2) limit values thereof which vary depending on an elapsed time from the start of the actual grinding or a position of work W relative to a grinding wheel 43.</p>
申请公布号 EP2666591(A1) 申请公布日期 2013.11.27
申请号 EP20110856276 申请日期 2011.12.22
申请人 JTEKT CORPORATION 发明人 KASUGA TOMOYUKI;SAITO ATSUSHI;YOSHIMI TAKAYUKI;IKEDA MASAO
分类号 B24B49/16 主分类号 B24B49/16
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