发明名称 Method of fabricating semiconductor device and the semiconductor device
摘要 A semiconductor device includes a semiconductor substrate, an insulating film formed above the semiconductor substrate, and a plurality of first buried wirings and a plurality of second buried wirings located in the insulating film at predetermined intervals alternately in a direction parallel to a surface of the semiconductor substrate. Each second buried wiring is formed so that a width between both side surfaces thereof is increased from a lower end toward an upper portion and at an upper surface the width is larger than a width at an upper surface of each first buried wiring.
申请公布号 US8592978(B2) 申请公布日期 2013.11.26
申请号 US20100729804 申请日期 2010.03.23
申请人 MATSUNO KOICHI;HIMENO YOSHIAKI;KABUSHIKI KAISHA TOSHIBA 发明人 MATSUNO KOICHI;HIMENO YOSHIAKI
分类号 H01L23/48;H01L23/52;H01L29/40 主分类号 H01L23/48
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