发明名称 Gallium nitride devices with compositionally-graded transition layer
摘要 The invention provides semiconductor materials including a gallium nitride material layer formed on a silicon substrate and methods to form the semiconductor materials. The semiconductor materials include a transition layer formed between the silicon substrate and the gallium nitride material layer. The transition layer is compositionally-graded to lower stresses in the gallium nitride material layer which can result from differences in thermal expansion rates between the gallium nitride material and the substrate. The lowering of stresses in the gallium nitride material layer reduces the tendency of cracks to form. Thus, the invention enables the production of semiconductor materials including gallium nitride material layers having few or no cracks. The semiconductor materials may be used in a number of microelectronic and optical applications.
申请公布号 US8592862(B2) 申请公布日期 2013.11.26
申请号 US201213728956 申请日期 2012.12.27
申请人 INTERNATIONAL RECTIFIER CORPORATION 发明人 WEEKS, JR. T. WARREN;PINER EDWIN L.;GEHRKE THOMAS;LINTHICUM KEVIN J.
分类号 C30B29/38;H01L29/66;C23C16/34;C30B23/02;C30B25/02;C30B25/18;H01L21/20;H01L21/205;H01L33/00;H01L33/32;H01S5/323;H01S5/343 主分类号 C30B29/38
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