发明名称 Delay line circuit, delay locked loop and tester system including the same
摘要 The invention provides a delay line circuit. The delay line circuit includes a delay line section and a feedback selection section. The delay line section receives an input clock signal and a feedback clock signal and delays one of the input clock signal and the feedback clock signal to generate an output clock signal, wherein the delay line section includes a plurality of delay units coupled in series. The feedback selection section is coupled to the delay line section and feedbacks the output clock signal to one of the delay units to serve as the feedback clock signal based on a selection signal. Wherein, one of the input clock signal and the feedback clock signal is delayed by a specific number of the delay units based on the selection signal to changes the frequency of the output clock signal.
申请公布号 US8593197(B1) 申请公布日期 2013.11.26
申请号 US201213606019 申请日期 2012.09.07
申请人 CHENG WEN-CHANG;NANYA TECHNOLOGY CORPORATION 发明人 CHENG WEN-CHANG
分类号 H03H11/26 主分类号 H03H11/26
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