发明名称 Height measurement apparatus, exposure apparatus, and device fabrication method
摘要 The present invention provides a measurement apparatus which measures a height of a test surface, the apparatus including an image sensing device including a plurality of detection units configured to detect interfering light formed by measurement light from the test surface and reference light from a reference surface, and an optical system configured to guide the measurement light and the reference light to the plurality of detection units, wherein the reference surface is placed such that differences are generated among optical path differences between measurement light beams and reference light beams which enter the plurality of detection units, respectively.
申请公布号 US8593615(B2) 申请公布日期 2013.11.26
申请号 US20100840553 申请日期 2010.07.21
申请人 SASAKI RYO;CANON KABUSHIKI KAISHA 发明人 SASAKI RYO
分类号 G03B27/52;G03B27/32 主分类号 G03B27/52
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