发明名称 Methods of forming a photo mask
摘要 Methods of fabricating a photo mask are provided. The method includes collecting sample data, setting a preliminary mask layout, performing an optical proximity correction using the sample data and a preliminary mask layout to obtain an optimized preliminary mask layout, verifying the optimized preliminary mask layout to obtain a final mask layout, and fabricating the photo mask using the final mask layout. Verification of the optimized preliminary mask layout includes operating a verification simulator using the sample data and the optimized preliminary mask layout as input data to obtain verification image data. The verification image data includes a plurality of contours of a pattern at different vertical positions.
申请公布号 US8595657(B2) 申请公布日期 2013.11.26
申请号 US201213366553 申请日期 2012.02.06
申请人 CHA HOSUN;LEE EUNMI;LEE SUNGWOO;SAMSUNG ELECTRONICS CO., LTD. 发明人 CHA HOSUN;LEE EUNMI;LEE SUNGWOO
分类号 G06F17/50;G03F1/00;G06F19/00;G21K5/00 主分类号 G06F17/50
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