发明名称 Forming inter-device STI regions and intra-device STI regions using different dielectric materials
摘要 An integrated circuit structure includes a substrate having a first portion in a first device region and a second portion in a second device region; and two insulation regions in the first device region and over the substrate. The two insulation regions include a first dielectric material having a first k value. A semiconductor strip is between and adjoining the two insulation regions, with a top portion of the semiconductor strip forming a semiconductor fin over top surfaces of the two insulation regions. An additional insulation region is in the second device region and over the substrate. The additional insulation region includes a second dielectric material having a second k value greater than the first k value.
申请公布号 US8592918(B2) 申请公布日期 2013.11.26
申请号 US20100843658 申请日期 2010.07.26
申请人 YUAN FENG;LEE TSUNG-LIN;CHEN HUNG-MING;CHANG CHANG-YUN;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 YUAN FENG;LEE TSUNG-LIN;CHEN HUNG-MING;CHANG CHANG-YUN
分类号 H01L21/02 主分类号 H01L21/02
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