发明名称 Pseudo buried layer and manufacturing method of the same, deep hole contact and bipolar transistor
摘要 The present invention discloses a pseudo buried layer, a deep hole contact and a bipolar transistor, and also discloses a manufacturing method of a pseudo buried layer, including: etching a silicon substrate to form an active region and shallow trenches; sequentially implanting phosphorous ion and arsenic ion into the bottom of the shallow trenches to form phosphorus impurity regions and arsenic impurity regions; conducting thermal annealing to the phosphorus impurity regions and arsenic impurity regions. The implantation of the pseudo buried layer, adopting phosphorous with rapid thermal diffusion and arsenic with slow thermal diffusion, can improve the impurity concentration on the surface of the pseudo buried layers, reduce the sheet resistance of the pseudo buried layer, form a good ohmic contact between the pseudo buried layer and a deep hole and reduce the contact resistance, and improve the frequency characteristic and current output of triode devices.
申请公布号 US8592870(B2) 申请公布日期 2013.11.26
申请号 US201113227387 申请日期 2011.09.07
申请人 LIU DONGHUA;QIAN WENSHENG;SHANGHAI HUA HONG NEC ELECTRONICS CO., LTD. 发明人 LIU DONGHUA;QIAN WENSHENG
分类号 H01L31/0328;H01L29/167;H01L29/207;H01L29/227;H01L31/0288;H01L31/0336;H01L31/072;H01L31/109 主分类号 H01L31/0328
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