| 摘要 |
The invention relates to non-destructive method of determination of transition temperature of thin (micron) layers of polymer isotropic and opaque materials of thermo-plastic media to plastic state. Before lighting, free surface of the sample is spatially deformed by means of impress of spatially ordered two-dimensional periodic mask, in sequence in steps the layer is heated to several values of stable temperatures, with keeping temperature constant each time during time exceeding the time of transitional processes in the layer. Residual intensity of first order of diffracted on excitations of free surface of layer light at all the values of fixed temperatures used is registered. After that the graph of residual temperature dependence of diffraction effectiveness is plotted, this is extrapolated to intersection with the axis of temperatures, there the point of intersection corresponds to the temperature of transition of the thin layer of polymer-containing thermo-plastic medium to plastic state. The invention provides possibility of measurements for thin films, for isotropic and opaque materials. |
