发明名称 ENHANCED SCANNER THROUGHPUT SYSTEM AND METHOD
摘要 A method and system to improve scanner throughput is provided. An image from a reticle is projected onto a substrate using a continuous linear scanning procedure in which an entire column of die or cells of die is scanned continuously, i.e. without stepping to a different location. Each scan includes translating a substrate with respect to a fixed beam. While the substrate is translated, the reticle is also translated. When a first die or cell of die is projected onto the substrate, the reticle translates along a direction opposite the scan direction and as the scan continues along the same direction, the reticle then translates in the opposite direction of the substrate thereby forming an inverted pattern on the next die or cell. The time associated with exposing the substrate is minimized as the stepping operation only occurs after a complete column of cells is scanned.
申请公布号 US2013309612(A1) 申请公布日期 2013.11.21
申请号 US201213473695 申请日期 2012.05.17
申请人 LIU YU-MEI;LIN CHIN-HSIANG;LIU HENG-HSIN;LEE HENG-JEN;HUANG I-HSIUNG;LIN CHIH-WEI;TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LIU YU-MEI;LIN CHIN-HSIANG;LIU HENG-HSIN;LEE HENG-JEN;HUANG I-HSIUNG;LIN CHIH-WEI
分类号 G03F7/20 主分类号 G03F7/20
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