发明名称 Double Diffused Metal Oxide Semiconductor Device and Manufacturing Method Thereof
摘要 The present invention discloses a double diffused metal oxide semiconductor (DMOS) device and a manufacturing method thereof. The DMOS device is formed in a first conductive type substrate, and includes a second conductive type high voltage well, a field oxide region, a gate, a second conductive type source, a second conductive type drain, a first conductive type body region, and a first conductive type deep well. The deep well is formed beneath and adjacent to the high voltage well in a vertical direction. The deep well and the high voltage well are defined by a same lithography process step.
申请公布号 US2013307072(A1) 申请公布日期 2013.11.21
申请号 US201213476043 申请日期 2012.05.21
申请人 HUANG TSUNG-YI;YANG CHING-YAO;RICHTEK TECHNOLOGY CORPORATION 发明人 HUANG TSUNG-YI;YANG CHING-YAO
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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