| 摘要 |
A pattern analysing device (27) in a pattern processing node {21} of a data collection system (10} comprises a pattern updating unit equipped with a pattern collecting element configured to obtain an existing pattern of historical data according to at least one existing data model, where the existing pattern relates to an entity (11) associated with the data collection system and obtain a further pattern of newer data according to a further data model, where the further pattern also relates to the entity, <<pattern updating element configured to compare the patterns with each other, determine if the existing data model can be mapped on the further data model and update the existing pattern with the further pattern in relation to the historical data if the existing data model can be mapped on the further data model.
|
