发明名称 CHARGED PARTICLE MULTI-BEAMLET LITHOGRAPHY SYSTEM AND COOLING ARRANGEMENT MANUFACTURING METHOD
摘要 <p>A charged particle multi-beamlet lithography system comprising a beamlet generator for generating beamlets, a beamlet modulator for forming modulated beamlets, and a beamlet projector for projecting the modulated beamlets onto a target surface. The generator, modulator and/or projector comprise one or more plates provided with apertures for letting the beamlets pass through the plate. The apertures are grouped to form beam areas distinct from non-beam areas having no beamlet apertures. At least one of the plates with apertures is provided with a cooling arrangement (93) disposed on its surface in a non-beam area. The cooling arrangement comprising a plate-shaped body with an inlet (31) for receiving a cooling liquid, a plurality of cooling channels (94) for conveying the cooling liquid therein, and an outlet (35) for removing the cooling liquid. Between the cooling channels, the plate- shaped body has slots (34) that are aligned with the beam areas.</p>
申请公布号 WO2013171216(A1) 申请公布日期 2013.11.21
申请号 WO2013EP59948 申请日期 2013.05.14
申请人 MAPPER LITHOGRAPHY IP B.V. 发明人 SPRENGERS, JOHANNES PETRUS;OTTEN, CHRISTIAAN;JAGER, REMCO;STEENBRINK, STIJN WILLEM HERMAN KAREL;KONING, JOHAN JOOST;URBANUS, WILLEM HENK;VAN VEEN, ALEXANDER HENDRIK VINCENT
分类号 H01J37/04;H01J37/317 主分类号 H01J37/04
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