发明名称 SILICON CARBIDE SEMICONDUCTOR DEVICE
摘要 A silicon carbide substrate includes a first layer of a first conductivity type, a second layer of a second conductivity type provided on the first layer, and a third layer provided on the second layer and doped with an impurity for providing the first conductivity type. The silicon carbide substrate has a trench formed through the third layer and the second layer to reach the first layer. The first layer has a concentration peak of the impurity in a position away from the trench in the first layer. As a result, a silicon carbide semiconductor device having an electric field relaxation structure that can be readily formed is provided.
申请公布号 US2013306986(A1) 申请公布日期 2013.11.21
申请号 US201313863043 申请日期 2013.04.15
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 WADA KEIJI;HIYOSHI TORU;MASUDA TAKEYOSHI
分类号 H01L29/06 主分类号 H01L29/06
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