发明名称 |
THERMAL CONDITIONING UNIT, LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD |
摘要 |
<p>A thermal conditioning unit (100) to thermally condition a substrate (W) in a lithographic apparatus, the thermal conditioning unit including: a thermal conditioning element (200) having a first layer (210), in use, facing the substrate and including a material having a thermal conductivity of 100 W/mK or more, a second layer (220) and a heat transfer component (230) positioned between the first and second layers; and a stiffening member (110) which is stiffer than the thermal conditioning element and configured to support the thermal conditioning element so as to reduce mechanical deformation thereof, wherein the thermal conditioning element is thermally isolated from the stiffening member.</p> |
申请公布号 |
WO2013171013(A1) |
申请公布日期 |
2013.11.21 |
申请号 |
WO2013EP57867 |
申请日期 |
2013.04.16 |
申请人 |
ASML NETHERLANDS B.V. |
发明人 |
JACOBS, JOHANNES, HENRICUS, WILHELMUS;WESTERLAKEN, JAN, STEVEN, CHRISTIAAN |
分类号 |
G03F7/20 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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