发明名称 METHOD OF FABRICATING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide: an SOI substrate suitable for a TFT and a method of fabricating the same; and a semiconductor device with high reliability using the SOI substrate and a method of fabricating the same.SOLUTION: When an SOI substrate is fabricated by using a technique typified by SIMOX, ELTRAN, or Smart-Cut, a single crystal semiconductor substrate having a main surface (crystal face) of a {110} plane is used. In such an SOI substrate, adhesion between a buried insulating layer as an underlayer and a single crystal silicon layer is high, and it becomes possible to realize a semiconductor device with high reliability.
申请公布号 JP2013236099(A) 申请公布日期 2013.11.21
申请号 JP20130151630 申请日期 2013.07.22
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;OTANI HISASHI
分类号 H01L21/336;H01L27/12;H01L21/02;H01L21/20;H01L21/265;H01L21/762;H01L29/786 主分类号 H01L21/336
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