发明名称 Encoding and decoding redundant bits to accommodate memory cells having stuck-at faults
摘要 <p>A data storage system has a memory circuit that comprises memory cells and a control circuit that receives data bits provided for storage in the memory cells. The control circuit encodes the data bits to generate a first set of redundant bits and encoded data bits, such that the encoded data bits selected for storage in a first subset of the memory cells with first stuck-at faults have digital values of corresponding ones of the first stuck-at faults. The control circuit encodes the first set of redundant bits to generate a second set of redundant bits. The control circuit performs logic functions on the second set of redundant bits and the encoded data bits to generate a third set of redundant bits, such that redundant bits in the third set of redundant bits selected for storage in a second subset of the memory cells with second stuck-at faults have digital values of corresponding ones of the second stuck-at faults.</p>
申请公布号 GB201317709(D0) 申请公布日期 2013.11.20
申请号 GB20130017709 申请日期 2013.10.07
申请人 HGST NETHERLANDS B.V. 发明人
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