发明名称 |
METHOD AND APPARATUS FOR INSPECTING VIA HOLE |
摘要 |
The present invention relates to a method and an apparatus for inspecting a via hole using a camera. Regarding a method for inspecting a via hole formed in a material, the method for inspecting a via hole of the present invention comprises the following steps: (a) an image is generated by photographing a via hole area; (b) an edge is extracted in the image; (c) a maximum value is detected by performing Hough Transform of the edge; (d) a circle area centering a position having the maximum value is calculated; and (e) the state of the via hole is determined by comparing the maximum value, the position and the circle area with a reference value. [Reference numerals] (411) Image is generated by photographing a via hole area;(421) Edge is extracted in the image;(431) Maximum value is detected by performing Hough Transform of the edge;(441) Circle area centering a position having the maximum value is calculated;(451) Maximum value and circle area are compared to reference values;(461) Fair treatment;(462) Fail treatment;(AA) Start;(BB) Maximum value and circle area > Reference values ?;(CC) End |
申请公布号 |
KR20130126370(A) |
申请公布日期 |
2013.11.20 |
申请号 |
KR20120050462 |
申请日期 |
2012.05.11 |
申请人 |
SAMSUNG TECHWIN CO., LTD. |
发明人 |
LEE, HWAL SUK |
分类号 |
H05K3/40;G01B11/00;G01N21/88 |
主分类号 |
H05K3/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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