发明名称 METHOD FOR FORMING WIRING, SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>The present invention provides a wire, which is having an adjusted shape, utilized a conductive layer which is containing copper. Further, the present invention provides a transistor having an electrode having a layer which is the same with the wire. Further, the present invention provides a semiconductor device having the transistor and the wire. The first conductive layer having the taper angle of 15&deg; to 45&deg; is formed at a stacked layer having a first conductive layer containing the copper and a second conductive layer on the first conductive layer by forming a resist mask on the second conductive layer and eliminating the part of the second conductive layer and the part of the first conductive layer using the resist mask as a mask before eliminating the resist mask.</p>
申请公布号 KR20130126479(A) 申请公布日期 2013.11.20
申请号 KR20130048536 申请日期 2013.04.30
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 SATO TAKAHIRO;CHO TAKAYUKI;KOSHIOKA SHUNSUKE;OHSHIMA TETSUYA;SAKAMOTO NAOYA
分类号 H01L21/28;H01L29/786 主分类号 H01L21/28
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