发明名称 |
METHOD FOR FORMING WIRING, SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
<p>The present invention provides a wire, which is having an adjusted shape, utilized a conductive layer which is containing copper. Further, the present invention provides a transistor having an electrode having a layer which is the same with the wire. Further, the present invention provides a semiconductor device having the transistor and the wire. The first conductive layer having the taper angle of 15° to 45° is formed at a stacked layer having a first conductive layer containing the copper and a second conductive layer on the first conductive layer by forming a resist mask on the second conductive layer and eliminating the part of the second conductive layer and the part of the first conductive layer using the resist mask as a mask before eliminating the resist mask.</p> |
申请公布号 |
KR20130126479(A) |
申请公布日期 |
2013.11.20 |
申请号 |
KR20130048536 |
申请日期 |
2013.04.30 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
SATO TAKAHIRO;CHO TAKAYUKI;KOSHIOKA SHUNSUKE;OHSHIMA TETSUYA;SAKAMOTO NAOYA |
分类号 |
H01L21/28;H01L29/786 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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