发明名称 SEMICONDUCTOR DEVICES HAVING THROUGH-CONTACTS AND RELATED FABRICATION METHODS
摘要 Apparatus for semiconductor device structures and related fabrication methods are provided. One method for fabricating a semiconductor device structure involves forming a layer of dielectric material overlying a doped region formed in a semiconductor substrate adjacent to a gate structure and forming a conductive contact in the layer of dielectric material. The conductive contact overlies and electrically connects to the doped region. The method continues by forming a second layer of dielectric material overlying the conductive contact, forming a voided region in the second layer overlying the conductive contact, forming a third layer of dielectric material overlying the voided region, and forming another voided region in the third layer overlying at least a portion of the voided region in the second layer. The method continues by forming a conductive material that fills both voided regions to contact the conductive contact.
申请公布号 KR101331250(B1) 申请公布日期 2013.11.20
申请号 KR20110123809 申请日期 2011.11.24
申请人 发明人
分类号 H01L21/28;H01L21/336;H01L29/78 主分类号 H01L21/28
代理机构 代理人
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