发明名称 Method to form a via
摘要 A method for forming a via, comprising (a) providing a structure comprising a mask (210) disposed on a semiconductor substrate (203), wherein the structure has an opening (215) defined therein which extends through the mask and into the substrate, and wherein the mask comprises a first electrically conductive layer; (b) depositing a second electrically conductive layer (219) such that the second conductive layer is in electrical contact with the first conductive layer, the second conductive layer having a first portion which extends over the surfaces of the opening and a second portion which extends over a portion of the mask adjacent to the opening; (c) removing the second portion of the second conductive layer; and (d) depositing a first metal (221) over the first portion of the second conductive layer.
申请公布号 US8586474(B2) 申请公布日期 2013.11.19
申请号 US201113040797 申请日期 2011.03.04
申请人 CHATTERJEE RITWIK;ACOSTA EDDIE;GARCIA SAM S.;MATHEW VARUGHESE;FREESCALE SEMICONDUCTOR, INC. 发明人 CHATTERJEE RITWIK;ACOSTA EDDIE;GARCIA SAM S.;MATHEW VARUGHESE
分类号 H01L21/44 主分类号 H01L21/44
代理机构 代理人
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