发明名称 Hybrid double box back gate silicon-on-insulator wafers with enhanced mobility channels
摘要 A semiconductor wafer structure for integrated circuit devices includes a bulk substrate; a lower insulating layer formed on the bulk substrate; an electrically conductive back gate layer formed on the lower insulating layer; an upper insulating layer formed on the back gate layer; and a hybrid semiconductor-on-insulator layer formed on the upper insulating layer, the hybrid semiconductor-on-insulator layer comprising a first portion having a first crystal orientation and a second portion having a second crystal orientation.
申请公布号 US8587063(B2) 申请公布日期 2013.11.19
申请号 US20090613574 申请日期 2009.11.06
申请人 DENNARD ROBERT H.;OUYANG QIQING C.;YAU JENG-BANG;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 DENNARD ROBERT H.;OUYANG QIQING C.;YAU JENG-BANG
分类号 H01L29/78 主分类号 H01L29/78
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